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Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples

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28.4K Views

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10:57 min

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February 3rd, 2017

DOI :

10.3791/55031-v

February 3rd, 2017

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M. Angélica Bello¹, Yolanda Ruiz-León², J. Vladimir Sandoval-Sierra³, Svetlana Rezinciuc⁴, Javier Diéguez-Uribeondo³

¹Biodiversity and Conservation Department, Real Jardín Botánico, CSIC, ²Research Support Unit, Real Jardín Botánico, CSIC, ³Mycology Department, Real Jardín Botánico, CSIC, ⁴Division of Glycoscience, AlbaNova University Center, Royal Institute of Technology (KTH)

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Scanning Electron Microscopy (SEM) Protocols for Problematic Plant, Oomycete, and Fungal Samples

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