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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

9.0K Views

10:42 min

June 16th, 2016

DOI :

10.3791/53870-v

June 16th, 2016

9,014 Views

1Department Lippstadt, Hamm-Lippstadt University of Applied Sciences

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X ray Computed Tomography CT
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