JoVE Logo
Faculty Resource Center

Sign In

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

DOI :

10.3791/53870-v

June 16th, 2016

June 16th, 2016

8,987 Views

1Department Lippstadt, Hamm-Lippstadt University of Applied Sciences

A workflow for comprehensive micro-characterization of active optical devices is outlined. It contains structural as well as functional investigations by means of CT, LM and SEM. The method is demonstrated for a white LED which can be still be operated during characterization.

Tags

LEDs

-- Views

Related Videos

article

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

article

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

article

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

article

Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography

article

Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy

article

Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy

article

Enhanced Electron Injection and Exciton Confinement for Pure Blue Quantum-Dot Light-Emitting Diodes by Introducing Partially Oxidized Aluminum Cathode

article

Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

article

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

article

Graphene-Assisted Quasi-van der Waals Epitaxy of AlN Film on Nano-Patterned Sapphire Substrate for Ultraviolet Light Emitting Diodes

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved