12.7K Views
•
09:51 min
•
April 22nd, 2013
DOI :
April 22nd, 2013
•0:05
Title
2:29
Sample Fabrication for Atom Probe Tomography Analysis
5:43
Atom Probe Tomography Analysis in a CAMECA LEAP 3000X HR System
6:31
Reconstruction of Atom Probe Tomography Data
7:13
Results: Elemental Maps and Concentration Depth Profiles of a Grain Boundary
8:38
Conclusion
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