この作品は、ドイツ研究協会（DFG）（契約CH 943/2-1）によって設立されています。著者は、この仕事のためにCIGS光吸収層を製造するためのZentrumのエリーゼのためSonnenenergieウントWasserstoff-Forschungバーデン·ヴュルテンベルク州からヴォルフガングDittus、とステファンPaetelに感謝したいと思います。

1。 CIGS層の成膜<ol><li>厚さ3mmのソーダライムガラス基板（SLG）の上にモリブデンのスパッタ堆積物は500nm（バックコンタクト層）。 </li><li>インライン多段CIGSプロセス24にCIGSの2μmのを共同蒸発。層はモリブデンバックコンタクト上に堆積得られたCIGSは、 図1に示されている。 </li><li>蛍光X線分析（XRF）によりCIGS層の不可欠な成分を測定します。得られたCIGS組成物を表1に示す。 </li></ol> 2。 APT分析のためのサイト固有のサンプル作製<ol><li>後述の試験片の支持体である、複数の端子の行を取得するために、2つの半分にTEMグリッドモーメントを切った。 5重量％で電解研磨によってピンの両端ホルダーとテーパー上に半グリッドTEMをマウントします。ダウン先端径&lt;2μmの％のNaOH。プロセスは、ステレオスコープを使用して制御合理的であることができます。その後、別のホルダーのT上に電解研磨グリッドをマウント帽子は、連続FIB、TEM、EBSD、およびAPT特性評価のために最適化されています。 </li><li>アンダーカット（図2a）を取得するためにFIBを用いたCIGS薄膜にミル2つのトレンチを。チャンクの左側に最初のフリーカットを行います。 </li><li>イオンビーム誘発化学蒸着によってPtの溶接を堆積させることによって、チャンクにマニピュレーターを取り付けます。次に、反対のサイトに最終的なフリーカットを作成し、自立チャンク（図2b）をアウト持ち上げます。 </li><li>抽出されたチャンクの良いジョイントを持つウェッジ（直径2-3ミクロン）になりましたTEM Moは半グリッドの鋭いピンを切り取ります。 Ptの堆積（ 図2c）を使用して、ピンにチャンクをマウントします。フリーカットついにモーメントピンの上に塊のほんの一部を（2μmの周り）を取得することを確認します。その後逆さまグリッドホルダーをマウントし、モーメントピンとPtとのマウント部分の間のギャップを埋める。残りのチャンクと同じ手順を追求しています。リフトアウトの詳細については手順、読者は次の参照集材作業を協議することができる。 </li><li>直立グリッドを配置し、FIBに低加速電圧やビーム電流（5 kVのと&lt;50 PA）を用いて、チャンクの断面を（シンナー白金溶接でサイトを選択します）きれいにしてください。したがって、一方は滑らかな表面とEBSD測定のために必要とされるのGa +注入に起因するより少ない汚染を取得します。 </li><li>断面で行わEBSD測定から興味のあるGBを選択します。 GBの配向は、議論の一部にさらに詳細に記載されているローカルの拡大効果26を低減する原子プローブ（z軸）での分析の方向に対して垂直であることが好ましい。 GBの適切な領域は、 図2Dで強調表示されます。 </li><li>鋭い先端を形成するために、ステップ2.6）で選択されたGBの領域で環状フライス加工を行います。曲率半径は、さらに、TEM investigatために十分に小さい（&lt;100 nm）でなければならないイオン。この目標に到達するために、工程（ 図2E）によって環状ミリングパターン工程の内径を減少させ、同時に二次電子（SE）で成形チップを可視化する。したがって、1は、ビームシフトを補正やエフェクト等をシャドウイング、歩留まりをスパッタ異なる由来する物質のリップルや再堆積のような先端に凹凸を除去するためにフライスパターンを調整することができます。 </li><li> CIGS GB単位（超合金のような）他の材料と比較してことを知って、TEMツール（ 図2Fを参照）を使用して、先端の頂点に関して、GB単位の正確な位置をローカライズするには、SEMには表示されません。 </li><li> GBはAPT先端内に配置されている正確に知ることは、FIBに戻って標本を転送し、先端の頂点下最大200 nmでGBを位置づけるために工場にサンプルを続ける。この段階では、ミリングは非常に低いキロボルト（kVの5）と低電流（&lt;50 PA）で行われる。確かに、ゴールは近いT GBをローカライズするだけではありません先端の頂点をO、ものGa +この手順の間APT先端の損傷を最小限にする。付随して、低kVのフライスに、SEMにおけるAPT先端の形状を視覚化し、先端の頂点（ 図2G）から削除する必要がある材料の量を制御します。 </li><li> TEM再び標本を転送し、先端の頂点に対するGBの位置を確認してください。 GB位置、試料直径半シャンク角の進化についての正確な知識を得るために、試料の全体画像（ 図2H）を作る。これは、APT最適なデータの再構成を達成するために必要である。さらに、電子ビーム誘起損傷やAPT測定で高い故障率につながることができ、Cの混入を最小限に抑えるために、低倍率と低露光時間を使用しています。 </li></ol> 3。 CAMECAのLEAP 3000X HRシステムでのAPT分析<ol><li> APTホールドで標本をマウントえー。次に、使用可能な4つのカルーセルのいずれかで標本パックをマウントします。 </li><li>ロードロック内部の試料パックを含むカルーセルを挿入し、ロードロックポンピング開始。ロードロック内部の真空度が〜10 -7 Torrのとき、バッファ室内カルーセルを挿入します。 </li><li> CAを待った後。バッファ室（〜7×10 -9トル）の真空を復元するには、1時間では、バッファ室からの主な分析室に標本を転送します。これは、手動で操作する装置である水平転送ロッドを使用して行われます。 </li><li> 60 Kに温度クールダウン、APT内部測定を開始する前にこの低温は、分析中の試料の表面で原子の拡散を避けることができます。私たちは、60 Kが設定温度ではなく、試料のレーザー熱により増加する必要がありますAPT先端で測定実際の温度であることをここで注意。ケロッグら 27、この温度が提案したようにトゥーレを考慮相対電荷状態比を取ることによって推定することができる。 CIGS物質の電界蒸発が不明であるため、残念なことに、この研究でチップの実際の温度は、主に計算できなかった。 </li><li> APT実験は、約532 nmおよび12ピコ秒パルス長の波長を有する緑色レーザを用いたレーザ·モードで行われる。 </li></ol> 4。 APTデータの再構築<ol><li> 3Dマップを再構築するために使用さCAMECAの統合可視化と解析ソフトウェアでRHITファイル（直接APT測定後に得られた生データ）（IVAS 3.6.2）は、一般的に28を開きます。 </li><li>次の8つのステップ28を使用して3Dマップの再構築を実行します。 <ol><li>ステップ1 -すべての性質についての詳細と、選択した研究の内容を与えて読み取り専用のペインですセットアップ 。 </li><li>ステップ2 - セレクトイオン系列範囲 。このステップは、試料に対してイオン系列範囲を規定している復元データに選択される電圧。 </li><li>ステップ3 - セレクトディテクタROI。このステップでは、検出器ROI（検出イベントヒストグラムの黒い楕円）の外側に位置するイオンを除去する機会を与えてくれます。 </li><li>ステップ4 - TOF訂正 。このステップは、電圧、飛行時間（TOF）、および分析のための検出器（ &#39;ボウル補正&#39;）補正の平坦性を計算する。 </li><li>ステップ5 - 質量キャリブレーション 。質量分析スペクトルの測定されたピーク位置は既知同位/充電状態​​で校正されています。 </li><li>ステップ6 - 遠隔イオン代入 。このステップでは、質量スペクトルのピークは、素子同位範囲に割り当てられている。 </li><li>ステップ7 - 再建 。電圧法、シャンク角法や先端プロファイルの方法：このステップでは、取得したデータから三再構成方法のいずれかを適用する。最後に、我々の3次元マップを再構築するために、現在の研究で使用されている。この方法では、TIのSEMやTEMイメージが必要図2Gおよび図2Hに示されているようにP、。再構成の任意の点における先端半径がSEM画像に定義された一連の点間の線形補間によって定義される。 </li><li>ステップ8 - 確認 。このステップでは、再構成タブで作成されたプレビューイメージを保存し分析に変換される。 </li></ol></li></ol>

<ol>
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H., Zunger, A., Katayama-Yoshida, H. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Defect+physics+of+the+CuInSe2+chalcopyrite+semiconductor.">Defect physics of the CuInSe2 chalcopyrite semiconductor.</a> Phys. Rev. B. 57, 9642-9656 (1998).</li><li>Cahn, J. W., Johnson, W. C., Blakely, J. M. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Interfacial Segregation. , 3-23 (1979).</li><li>Miller, M. K., Jayaram, R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Some+factors+affecting+analysis+in+atom+probe.">Some factors affecting analysis in atom probe.</a> Surf. Sci. 266, 458-462 (1992).</li><li>Wuerz, R., Eicke, A., Kessler, F., Paetel, S., Efimenko, S., Schlegel, C. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=CIGS+thin-film+solar+cells+and+modules+on+enamelled+steel+substrates.">CIGS thin-film solar cells and modules on enamelled steel substrates.</a> Sol. Energy. 100, 132-137 (2012).</li><li>De Geuser, F., Lefebvre, W., Danoix, F., Vurpillot, F., Forbord, B., Blavette, D. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=An+improved+reconstruction+procedure+for+the+correction+of+local+magnification+effects+in+three-dimensional+atom-probe.">An improved reconstruction procedure for the correction of local magnification effects in three-dimensional atom-probe.</a> Surf. Interf. Anal. 39, 268-272 (2007).</li><li>Kingham, D. R. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=The+post-ionization+of+field+evaporated+ions:+A+theoretical+explanation+of+multiple+charge+states.">The post-ionization of field evaporated ions: A theoretical explanation of multiple charge states.</a> Surf. Sci. 116, 273-301 (1982).</li><li>Letellier, L. <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=.">.</a> Etude des joints de grains et interphases dans les superalliages Astroloy par microscopie electronique et tomographie atomique [dissertation]. , (1994).</li><li>Hoummada, I., Mangelinck, K., Chow, D., Lee, J., Bernardini, <a target="_blank" href="http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed&cmd=Search&doptcmdl=Citation&defaultField=Title+Word&term=Original+methods+for+diffusion+measurements+in+polycrystalline+thin-films.">Original methods for diffusion measurements in polycrystalline thin-films.</a> Defect and Diffusion Forum. 322, 129-150 (2012).</li></ol>

<p class="jove_content"&gt;著者は、開示することは何もありません。</p&gt;

現在の研究ではCIGS光起電用途に使用される化合物半導体材料におけるランダムHAGBにAPTの結果を提示している。さらに、我々はまた、EBSDやTEMなどの補完技術と併せてそのAPTを示している、CIGS太陽電池の構造物のプロパティの関係を解明するための強力なツールです。まず、EDX / EELSは粒界に低NaおよびO濃度を検出し、第二に、EDX / EELS、特に、すべての要素に敏感ではないためではない十分な?...

<html>吸収材料としてのカルコパイライト構造化された化合物半導体のCu（、ジョージア州）のSe 2（CIGS）に基づいて薄膜太陽電池は、その高い効率、耐放射性、長期安定した二十年以上のために開発されているパフォーマンス、および1-3低生産コスト。これらの太陽電池は、すなわち、CIGS吸収体層の良好な光学的性質に起因する僅か材料消費で直接バンドギャップおよび高い吸収係数1,2を製造することができる。厚さがわずか数マイクロメートルの吸収体膜は、高い光電流を生成するのに十分である。電極に光生成電荷キャリアの拡散経路が比較的短いので、CIGS吸収体は、多結晶形態で製造することができる。太陽電池は、これまで達成されたCu（では、ガリウム）のSe 2の最大効率（CIGS）は、すべての薄膜太陽電池の中で最も高い値である20.4％4である。 ove_content &quot;&gt;さらに、両方の製造コストの低減及​​び太陽電池効率の向上が不可欠である。後者はCIGS吸収体層の微細構造と化学組成に強く依存している。ジャンプインタフェースは、CIGS薄膜太陽電池技術を確立するために、吸収器内の特定の結晶粒界（GB単位）で、それらは光生成電荷キャリアの輸送に影響を与えることができるように、極めて重要な役割を果たす。 CIGS太陽電池に関して、主未解決の問題の一つは、CIGS GB単位の良性の性質、 すなわち多結晶 CIGS吸収フィルムは、GB単位と格子欠陥の密度が高いにもかかわらず、優れた細胞の効率が得られます。 何人かの著者は、その電気的特性5,6、文字と方位7-9と同様に不純物偏析10-13に関してソーラーグレードのCIGS膜でGB単位を検討した。これらproperti間しかし、明確なリンクなしエスこれまでに確立することができる。特に、局所的な化学組成及びGBとの不純物含有量に関する情報の実質的な欠如している。 過去二十年では、アトムプローブトモは（APT）の有望なナノ分析技術14-17の一つとして浮上している。最近まで太陽電池の研究は、主にAPTサンプル調製プロセスにおける困難と従来のパルス電圧原子プローブを用いた半導体材料の分析の限られた能力によって制限されている。これらの制限は、主に&#39;リフトアウト法&#39;集束イオンビーム（FIB）加工18およびAPTパルスレーザ16の導入に基づいての開発によって克服されています。 CIGS太陽電池の特性評価APTについて、いくつかの論文が強くさらなる調査のために奨励され、19-23を発表してきた。 本論文では、iの内部勉強する方法のガイドラインを提供しますアトムプローブ断層撮影法によるCIGS薄膜太陽電池でnterfaces。

atom probe tomography studies on the cu(in,ga)se2 grain boundaries

現存する技術と比較して、アトムプローブトモグラフィは、化学的にナノスケールで、三次元の内部インターフェースを特徴づけることができるユニークな手法です。確かに、APTは高感度（ppmオーダー）と高い空間分解能（サブnm）を持っています。 かなりの努力が知られている構造を有する所望の粒界が含まれているAPTチップを作製し、ここで行った。実際に、集束イオンビーム、電子後方散乱回折、および透過電子顕微鏡を組み合わせ用いて部位特異的試料調製は、本研究で示されている。この方法では、アトムプローブトモグラフィーによって研究される銅の既知の構造と場所（で、GA）のSe 2薄膜で選択した粒界を可能にします。 最後に、我々は、Cuの粒界を研究するアトムプローブ断層撮影法（インとGa）Seを2薄膜太陽電池を使用することの利点と欠点を議論する。

図3は側面図（XZスライス）ランダム高角GB（HAGB）28.5の元素マップを示し° - &lt;511&gt; カブは、サイト固有の調製方法により、図2で選択した。 CIGS HAGBでのNa、K、およびOの共分離を直接APT使ってマッピングされています。これらの不純物は、ほとんどの場合〜600℃でCIGS層の堆積の間に吸収体層にSLG基板のうち拡散 図4aは、図3?...

Watch this Scientific Journal Video about Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries at JoVE.com

Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

本研究では、CIGS太陽電池の光吸収層の粒界を研究するための原子プローブ断層撮影技術の使用を記載している。公知の構造の所望の粒界を含むアトムプローブ·チップを製造するための新しいアプローチは、ここで提示される。

銅上のア​​トムプローブトモグラフィ研究（、ジョージア州）SE<sub&gt; 2</sub&gt;粒界

Compared with the existent techniques, atom probe tomography is a unique technique able to chemically characterize the internal interfaces at the ...

atom-probe-tomography-studies-on-the-cuingase2-grain-boundaries

Research

JoVE Journal

Engineering

Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries

12.6K ビュー.  Max-Planck-Institut für Eisenforschung GmbH. 本研究では、CIGS太陽電池の光吸収層の粒界を研究するための原子プローブ断層撮影技術の使用を記載している。公知の構造の所望の粒界を含むアトムプローブ·チップを製造するための新しいアプローチは、ここで提示される。

ビデオ: Atom Probe Tomography Studies on the CuIn,GaSe2 Grain Boundaries

Scanning-probe Single-electron Capacitance Spectroscopy

The integration of low-temperature scanning-probe techniques and single-electron capacitance spectroscopy represents a powerful tool to study the electronic quantum structure of small systems - including individual atomic dopants in semiconductors. Here we present a capacitance-based method, known as Subsurface Charge Accumulation (SCA) imaging, which is capable of resolving single-electron charging while achieving sufficient spatial resolution to image individual atomic dopants. The use of a capacitance technique enables observation of subsurface features, such as dopants buried many nanometers beneath the surface of a semiconductor material1,2,3. In principle, this technique can be applied to any system to resolve electron motion below an insulating surface.
As in other electric-field-sensitive scanned-probe techniques4, the lateral spatial resolution of the measurement depends in part on the radius of curvature of the probe tip. Using tips with a small radius of curvature can enable spatial resolution of a few tens of nanometers. This fine spatial resolution allows investigations of small numbers (down to one) of subsurface dopants1,2. The charge resolution depends greatly on the sensitivity of the charge detection circuitry; using high electron mobility transistors (HEMT) in such circuits at cryogenic temperatures enables a sensitivity of approximately 0.01 electrons/Hz&frac12; at 0.3 K 5.

Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

走査プローブ単電子容量分光

The integration of low-temperature scanning-probe techniques and single-electron capacitance spectroscopy represents a powerful tool to study the ...

工学

The Measurement of Unsteady Surface Pressure Using a Remote Microphone Probe

Microphones are widely applied to measure pressure fluctuations at the walls of solid bodies immersed in turbulent flows. Turbulent motions with various characteristic length scales can result in pressure fluctuations over a wide frequency range. This property of turbulence requires sensing devices to have sufficient sensitivity over a wide range of frequencies. Furthermore, the small characteristic length scales of turbulent structures require small sensing areas and the ability to place the sensors in very close proximity to each other. The complex geometries of the solid bodies, often including large surface curvatures or discontinuities, require the probe to have the ability to be set up in very limited spaces. The development of a remote microphone probe, which is inexpensive, consistent, and repeatable, is described in the present communication. It allows for the measurement of pressure fluctuations with high spatial resolution and dynamic response over a wide range of frequencies. The probe is small enough to be placed within the interior of typical wind tunnel models. The remote microphone probe includes a small, rigid, and hollow tube that penetrates the model surface to form the sensing area. This tube is connected to a standard microphone, at some distance away from the surface, using a "T" junction. An experimental method is introduced to determine the dynamic response of the remote microphone probe. In addition, an analytical method for determining the dynamic response is described. The analytical method can be applied in the design stage to determine the dimensions and properties of the RMP components.

Here, we present a protocol to measure, with high spatial resolution, the unsteady surface pressure in turbulent flows. This method demonstrates the construction of a remote microphone probe (RMP) and the determination of its frequency-dependent, complex transfer function. An analytical determination of the dynamic response is presented and validated.

リモートマイクプローブを用いた非定常面圧の測定

Microphones are widely applied to measure pressure fluctuations at the walls of solid bodies immersed in turbulent flows. Turbulent motions with various ...

Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy (ATOM)

Scaling the number of measurable parameters, which allows for multidimensional data analysis and thus higher-confidence statistical results, has been the main trend in the advanced development of flow cytometry. Notably, adding high-resolution imaging capabilities allows for the complex morphological analysis of cellular/sub-cellular structures. This is not possible with standard flow cytometers. However, it is valuable for advancing our knowledge of cellular functions and can benefit life science research, clinical diagnostics, and environmental monitoring. Incorporating imaging capabilities into flow cytometry compromises the assay throughput, primarily due to the limitations on speed and sensitivity in the camera technologies. To overcome this speed or throughput challenge facing imaging flow cytometry while preserving the image quality, asymmetric-detection time-stretch optical microscopy (ATOM) has been demonstrated to enable high-contrast, single-cell imaging with sub-cellular resolution, at an imaging throughput as high as 100,000 cells/s. Based on the imaging concept of conventional time-stretch imaging, which relies on all-optical image encoding and retrieval through the use of ultrafast broadband laser pulses, ATOM further advances imaging performance by enhancing the image contrast of unlabeled/unstained cells. This is achieved by accessing the phase-gradient information of the cells, which is spectrally encoded into single-shot broadband pulses. Hence, ATOM is particularly advantageous in high-throughput measurements of single-cell morphology and texture &#8211; information indicative of cell types, states, and even functions. Ultimately, this could become a powerful imaging flow cytometry platform for the biophysical phenotyping of cells, complementing the current state-of-the-art biochemical-marker-based cellular assay. This work describes a protocol to establish the key modules of an ATOM system (from optical frontend to data processing and visualization backend), as well as the workflow of imaging flow cytometry based on ATOM, using human cells and micro-algae as the examples.

Microfluidic Imaging Flow Cytometry by Asymmetric-detection Time-stretch Optical Microscopy ATOM

This protocol describes the implementation of an asymmetric-detection time-stretch optical microscopy system for single-cell imaging in ultrafast microfluidic flow and its applications in imaging flow cytometry.

非対称検出時間ストレッチ光学顕微鏡（ATOM）によるマイクロ流体イメージングフローサイトメトリー

Scaling the number of measurable parameters, which allows for multidimensional data analysis and thus higher-confidence statistical results, has been the ...

In Situ Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for Cu(In,Ga)Se2 Solar Cells

The levelized cost of electricity (LCOE) of photovoltaic (PV) systems is determined by, among other factors, the PV module reliability. Better prediction of degradation mechanisms and prevention of module field failure can consequently decrease investment risks as well as increase the electricity yield. An improved knowledge level can for these reasons significantly decrease the total costs of PV electricity. 
In order to better understand and minimize the degradation of PV modules, the occurring degradation mechanisms and conditions should be identified. This should preferably happen under combined stresses, since modules in the field are also simultaneously exposed to multiple stress factors. Therefore, two 'Combined Stress test with in situ measurement' setups have been designed and constructed. These setups allow the simultaneous use of humidity, temperature, illumination, and electrical biases as independently controlled stress factors on solar cells and minimodules. The setups also allow real-time monitoring of the electrical properties of these samples. This protocol presents these setups and describes the experimental possibilities. Moreover, results obtained with these setups are also presented: various examples about the influence of both deposition and degradation conditions on the stability of thin film Cu(In,Ga)Se2 (CIGS) as well as Cu2ZnSnSe4 (CZTS) solar cells are described. Results on the temperature dependency of CIGS solar cells are also presented.

In Situ Monitoring of the Accelerated Performance Degradation of Solar Cells and Modules: A Case Study for CuIn,GaSe2 Solar Cells

Two &#39;Combined Stress test with in situ measurement&#39; setups, which allow real-time monitoring of accelerated degradation of solar cells and modules, were designed and constructed. These setups allow the simultaneous use of humidity, temperature, electrical biases, and illumination as independently controlled stress factors. The setups and various experiments executed are presented.

その場で太陽電池とモジュールの加速劣化のモニタリング: Cu (In, Ga) Se2太陽電池に関するケーススタディ

The levelized cost of electricity (LCOE) of photovoltaic (PV) systems is determined by, among other factors, the PV module reliability. Better prediction ...

Fabrication of Magnetic Nanostructures on Silicon Nitride Membranes for Magnetic Vortex Studies Using Transmission Microscopy Techniques

Electron and x-ray magnetic microscopies allow for high-resolution magnetic imaging down to tens of nanometers. However, the samples need to be prepared on transparent membranes which are very fragile and difficult to manipulate. We present processes for the fabrication of samples with magnetic micro- and nanostructures with spin configurations forming magnetic vortices suitable for Lorentz transmission electron microscopy and magnetic transmission x-ray microscopy studies. The samples are prepared on silicon nitride membranes and the fabrication consists of a spin coating, UV and electron-beam lithography, the chemical development of the resist, and the evaporation of the magnetic material followed by a lift-off process forming the final magnetic structures. The samples for the Lorentz transmission electron microscopy consist of magnetic nanodiscs prepared in a single lithography step. The samples for the magnetic x-ray transmission microscopy are used for time-resolved magnetization dynamic experiments, and magnetic nanodiscs are placed on a waveguide which is used for the generation of repeatable magnetic field pulses by passing an electric current through the waveguide. The waveguide is created in an extra lithography step.

A protocol for the fabrication of magnetic micro- and nanostructures with spin configurations forming magnetic vortices suitable for transmission electron microscopy (TEM) and magnetic transmission x-ray microscopy (MTXM) studies is presented.

磁気渦の研究伝達顕微鏡検査の技術を使用してシリコン窒化膜の磁性ナノ構造の作製

Electron and x-ray magnetic microscopies allow for high-resolution magnetic imaging down to tens of nanometers. However, the samples need to be prepared ...

Fabrication of Robust Nanoscale Contact between a Silver Nanowire Electrode and CdS Buffer Layer in Cu(In,Ga)Se2 Thin-film Solar Cells

Silver nanowire transparent electrodes have been employed as window layers for Cu(In,Ga)Se2 thin-film solar cells. Bare silver nanowire electrodes normally result in very poor cell performance. Embedding or sandwiching silver nanowires using moderately conductive transparent materials, such as indium tin oxide or zinc oxide, can improve cell performance. However, the solution-processed matrix layers can cause a significant number of interfacial defects between transparent electrodes and the CdS buffer, which can eventually result in low cell performance. This manuscript describes how to fabricate robust electrical contact between a silver nanowire electrode and the underlying CdS buffer layer in a Cu(In,Ga)Se2 solar cell, enabling high cell performance using matrix-free silver nanowire transparent electrodes. The matrix-free silver nanowire electrode fabricated by our method proves that the charge-carrier collection capability of silver nanowire electrode-based cells is as good as that of standard cells with sputtered ZnO:Al/i-ZnO as long as the silver nanowires and CdS have high-quality electrical contact. The high-quality electrical contact was achieved by depositing an additional CdS layer as thin as 10 nm onto the silver nanowire surface.

Fabrication of Robust Nanoscale Contact between a Silver Nanowire Electrode and CdS Buffer Layer in CuIn,GaSe2 Thin-film Solar Cells

In this protocol, we describe the detailed experimental procedure for the fabrication of a robust nanoscale contact between a silver nanowire network and CdS buffer layer in a CIGS thin-film solar cell.

Cu(In,Ga)Se2薄膜太陽電池における銀ナノワイヤー電極とCdSバッファー層間の堅牢なナノスケール接触の製造

Silver nanowire transparent electrodes have been employed as window layers for Cu(In,Ga)Se2 thin-film solar cells. Bare silver nanowire electrodes ...

Visualization of Failure and the Associated Grain-Scale Mechanical Behavior of Granular Soils under Shear using Synchrotron X-Ray Micro-Tomography

The rapid development of X-ray imaging techniques with image processing and analysis skills has enabled the acquisition of CT images of granular soils with high-spatial resolutions. Based on such CT images, grain-scale mechanical behavior such as particle kinematics (i.e., particle translations and particle rotations), strain localization and inter-particle contact evolution of granular soils can be quantitatively investigated. However, this is inaccessible using conventional experimental methods. This study demonstrates the exploration of the grain-scale mechanical behavior of a granular soil sample under triaxial compression using synchrotron X-ray micro-tomography (&#956;CT). With this method, a specially fabricated miniature loading apparatus is used to apply confining and axial stresses to the sample during the triaxial test. The apparatus is fitted into a synchrotron X-ray tomography setup so that high-spatial resolution CT images of the sample can be collected at different loading stages of the test without any disturbance to the sample. With the capability of extracting information at the macro scale (e.g., sample boundary stresses and strains from the triaxial apparatus setup) and the grain scale (e.g., grain movements and contact interactions from the CT images), this procedure provides an effective methodology to investigate the multi-scale mechanics of granular soils.

The protocol describes procedures to acquire high-spatial resolution computed tomography (CT) images of a granular soil during triaxial compression, and to apply image processing techniques to these CT images to explore the grain-scale mechanical behavior of the soil under loading.

シンクロトロンX線マイクロ断層撮影によるせん断下の粒状土壌の故障の可視化と関連する粒状土壌の機械的挙動

The rapid development of X-ray imaging techniques with image processing and analysis skills has enabled the acquisition of CT images of granular soils ...

Improving the Combustion Performance of a Hybrid Rocket Engine using a Novel Fuel Grain with a Nested Helical Structure

A technique to improve the combustion performance of a hybrid rocket engine using a novel fuel grain structure is presented. This technique utilizes the different regression rates of acrylonitrile butadiene styrene and paraffin-based fuels, which increase the exchanges of both matter and energy by swirl flow and recirculation zones formed at the grooves between the adjacent vanes. The centrifugal casting technique is used to cast the paraffin-based fuel into an acrylonitrile butadiene styrene substrate made by three-dimensional printing. Using oxygen as the oxidizer, a series of tests were conducted to investigate the combustion performance of the novel fuel grain. In comparison to paraffin-based fuel grains, the fuel grain with a nested helical structure, which can be maintained throughout the combustion process, showed significant improvement in the regression rate and great potential in improvement of combustion efficiency.

A technique utilizing a solid fuel grain with a novel nested helical structure to improve the combustion performance of a hybrid rocket engine is presented.

ネストされたらせん構造を持つ新規燃料粒子を用いたハイブリッドロケットエンジンの燃焼性能の向上

A technique to improve the combustion performance of a hybrid rocket engine using a novel fuel grain structure is presented. This technique utilizes the ...

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Kelvin probe force microscopy (KPFM), sometimes referred to as surface potential microscopy, is the nanoscale version of the venerable scanning Kelvin probe, both of which measure the Volta potential difference (VPD) between an oscillating probe tip and a sample surface by applying a nulling voltage equal in magnitude but opposite in sign to the tip-sample potential difference. By scanning a conductive KPFM probe over a sample surface, nanoscale variations in surface topography and potential can be mapped, identifying likely anodic and cathodic regions, as well as quantifying the inherent material driving force for galvanic corrosion.
Subsequent co-localization of KPFM Volta potential maps with advanced scanning electron microscopy (SEM) techniques, including back scattered electron (BSE) images, energy dispersive spectroscopy (EDS) elemental composition maps, and electron backscattered diffraction (EBSD) inverse pole figures can provide further insight into structure-property-performance relationships. Here, the results of several studies co-localizing KPFM with SEM on a wide variety of alloys of technological interest are presented, demonstrating the utility of combining these techniques at the nanoscale to elucidate corrosion initiation and propagation.
Important points to consider and potential pitfalls to avoid in such investigations are also highlighted: in particular, probe calibration and the potential confounding effects on the measured VPDs of the testing environment and sample surface, including ambient humidity (i.e., adsorbed water), surface reactions/oxidation, and polishing debris or other contaminants. Additionally, an example is provided of co-localizing a third technique, scanning confocal Raman microscopy, to demonstrate the general applicability and utility of the co-localization method to provide further structural insight beyond that afforded by electron microscopy-based techniques.

Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

ケルビンプローブ力顕微鏡と他の顕微鏡および分光法との共局在化:合金の腐食特性評価における選択されたアプリケーション

Kelvin probe force microscopy (KPFM), sometimes referred to as surface potential microscopy, is the nanoscale version of the venerable scanning Kelvin ...

Application of Deep Learning-Based Medical Image Segmentation via Orbital Computed Tomography

Recently, deep learning-based segmentation models have been widely applied in the ophthalmic field. This study presents the complete process of constructing an orbital computed tomography (CT) segmentation model based on U-Net. For supervised learning, a labor-intensive and time-consuming process is required. The method of labeling with super-resolution to efficiently mask the ground truth on orbital CT images is introduced. Also, the volume of interest is cropped as part of the pre-processing of the dataset. Then, after extracting the volumes of interest of the orbital structures, the model for segmenting the key structures of the orbital CT is constructed using U-Net, with sequential 2D slices that are used as inputs and two bi-directional convolutional long-term short memories for conserving the inter-slice correlations. This study primarily focuses on the segmentation of the eyeball, optic nerve, and extraocular muscles. The evaluation of the segmentation reveals the potential application of segmentation to orbital CT images using deep learning methods.

Application of Deep Learning-Based Medical Image Segmentation via Orbital Computed Tomography

An object segmentation protocol for orbital computed tomography (CT) images is introduced. The methods of labeling the ground truth of orbital structures by using super-resolution, extracting the volume of interest from CT images, and modeling multi-label segmentation using 2D sequential U-Net for orbital CT images are explained for supervised learning.

銅上のア​​トムプローブトモグラフィ研究（、ジョージア州）SE

銅上のアトムプローブトモグラフィ研究（、ジョージア州）SE