December 7th, 2015
•A method for the growth of low temperature vertically-aligned carbon nanotubes, and the subsequent fabrication of vertical interconnect electrical test structures using semiconductor fabrication is presented.
Videos relacionados
Fabrication, Densification, and Replica Molding of 3D Carbon Nanotube Microstructures
Dry Oxidation and Vacuum Annealing Treatments for Tuning the Wetting Properties of Carbon Nanotube Arrays
Synthesis and Functionalization of Nitrogen-doped Carbon Nanotube Cups with Gold Nanoparticles as Cork Stoppers
Writing and Low-Temperature Characterization of Oxide Nanostructures
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Advanced Experimental Methods for Low-temperature Magnetotransport Measurement of Novel Materials
Precision Milling of Carbon Nanotube Forests Using Low Pressure Scanning Electron Microscopy
High Temperature Fabrication of Nanostructured Yttria-Stabilized-Zirconia (YSZ) Scaffolds by In Situ Carbon Templating Xerogels
Fabrication of 3D Carbon Microelectromechanical Systems (C-MEMS)
Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
ACERCA DE JoVE
Copyright © 2024 MyJoVE Corporation. Todos los derechos reservados