We greatly acknowledge J. Garrevoet, M. Seyrich, A. Schropp, D. Br&#252;ckner, J. Hagemann, K. Spiers, and T. Boese from the Deutsches Elektronen-Synchrotron (DESY) and A. Kolditz, J. Siebels, J. Fl&#252;gge, C. Strelow, T. Kipp, and A. Mews from the University of Hamburg for supporting measurements at beamline P06 at PETRA III, DESY; M. Holt, Z. Cai, M. Cherukara, and V. Rose from the Argonne National Laboratory (ANL) for supporting measurements at beamline 26-ID-C at the Advanced Photon Source (APS) at ANL; D. Salomon and R. Tucoulou from the European Synchrotron Radiation Facility (ESRF) for supporting measurements at beamline ID16B at ESRF; R. Farshchi, D. Poplavkyy, and J. Bailey from MiaSol&#233; Hi-Tech Corp., and E. Avancini, Y. Romanyuk, S. B&#252;cheler, and A. Tiwari from the Swiss Federal Laboratories for Materials Science and Technology (EMPA) for providing solar cells. We acknowledge DESY (Hamburg, Germany), a member of the Helmholtz Association HGF, for the provision of experimental facilities. We acknowledge the European Synchrotron Radiation Facility (Grenoble, France) for provision of synchrotron radiation facilities. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.

The authors have nothing to disclose.

An erratum was issued for: <a href="https://www.jove.com/t/60001/x-ray-beam-induced-current-measurements-for-multi-modal-x-ray">X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells</a>. An equation&#160;was&#160;updated.
Equation 9&#160;was updated from:
<img alt="Equation" src="/files/ftp_upload/60001/60001eq58v5.jpg" />
to:
<img alt="Equation" src="/files/ftp_upload/60001/60001eq58v9.png" />

An erratum was issued for: <a href="https://www.jove.com/t/60001/x-ray-beam-induced-current-measurements-for-multi-modal-x-ray">X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells</a>. An equation&#160;was&#160;updated.

Erratum: X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

In a world where the demand for electrical energy is constantly rising, a clean and sustainable energy source is increasingly necessary. One possibility to tackle these demands are photovoltaic (PV) systems1,2,3. For a directed and efficient way of developing next-generation solar cells, it is necessary to understand how the composition and structure of the solar cells affect their performance4. Typical questions in solar cell development include: Which types of defects are most detrimental, and where are they located5,6? Are there inhomogeneities in the elemental distribution, and what is their impact7,8,9? How do the solar cells change upon module assembly and aging10,11?
As a solar cell is only as good as its weakest part, it is especially important to understand the effect of compositional and structural variation on the performance in polycrystalline solar cells that suffer inherently from inhomogeneities7,8. This is particularly true for thin film (TF) solar cells, which contain absorber layers with crystallite sizes in the micrometer range. Here, the effect of grain boundaries on performance is of highest interest, but their small size and the fact that they are buried in an entire layer stack pose unique characterization challenges. Furthermore, the complex chemistry of multi-component absorber layers with co-existing phases and internal gradients require sophisticated characterization methods12.
Synchrotron-based hard X-ray microscopes are able to meet the characterization challenges of TF solar cells: they provide X-ray spot sizes down to the nanometer scale13,14,15,16 and the penetration depth of hard X-rays allows to probe the different device layers17, including buried absorber layers. With a wealth of different measurement techniques at a scanning X-ray microscope, it becomes possible to simultaneously study not just one, but many different aspects of solar cells within multi-modal measurements and to correlate the observed characteristics. For example, X-ray beam induced current (XBIC) measurements have successfully been combined with X-ray fluorescence (XRF)7,18,19, X-ray excited optical luminescence (XEOL)20,21, and X-ray diffraction (XRD)22 to correlate the electrical performance with composition, optical performance, and structure, respectively23.
During XBIC measurements of solar cells or other devices under test (DUT)24,25, the incident X-ray photons set off particle showers consisting of electrons and photons, resulting in a multitude of excited electron-hole pairs per incident X-ray photon in the semiconducting absorber material. Finally, the electron-hole pairs thermalize to the band edges of the solar cell absorber. Therefore, these X-ray excited charge carriers can be treated like charge carriers that are generated by the absorption of photons with energies just above the bandgap during normal solar cell operation, and the resulting current or voltage can be measured as X-ray beam induced current23,26,27 or voltage (XBIV)28,29 similar to more common measurements like electron-beam induced current (EBIC) or laser-beam induced current (LBIC). Consequently, the XBIC/XBIV signal not only depends on the thickness of the absorber layer, but also on the electric performance of the DUT, both at the microscopic and macroscopic level, including the local bandgap, Fermi-level splitting, and recombination. Thus, we are able to map local variations of the charge-carrier collection efficiency that is defined as the probability that an externally excited electron-hole pair in the absorber layer is collected at the electrical contacts of the DUT.
Note that only electron-hole pairs that are generated in the absorber layer of the DUT contribute to the XBIC/XBIV signal. Charge carriers generated in other layers such as the metallic contacts or substrate will immediately recombine, as they have no possibility of being separated by the junction. Therefore, other layers only affect XBIC/XBIV measurements via secondary effects such as parasitic X-ray absorption or the emission of secondary photons and electrons that may be re-absorbed in the absorber layer. In contrast, all layers potentially contribute to the XRF signal.
Given that the XBIC and XBIV signals can be small (often, variations in the sub-picoampere and nanovolt range are of interest), the signals are easily buried in noise. Therefore, we suggested to utilize lock-in amplification to extract the XBIC and XBIV signals30. For this purpose, the incoming X-ray beam is modulated by an optical chopper as indicated in Figure&#160;1. This modulation carries over to the signal produced by the DUT. Before the signal is fed into the lock-in amplifier (LIA), a pre-amplifier (PA) is typically used to match the raw signal intensity with the range of the analog-to-digital converter at the input of the digital LIA. The LIA mixes the modulated measurement signal with the reference signal. By employing a low-pass filter, only frequencies close to the reference signal are passed through and amplified31. This allows for an effective extraction of the XBIC or XBIV signal from a noisy background.
In the protocol, we introduce the prerequisites and motions necessary for taking successful XBIC measurements including the raw signal (direct current, DC) and the modulated signal (alternating current, AC). Beyond describing technical details, we discuss an XBIC setup in the context of multi-modal measurements at beamline P06 at PETRA III13. Please note that, compared to most laboratory experiments, the environment of hutches at hard X-ray nanoprobes requires particular planning and consideration. Specifically, multi-modal measurements with nanometer-scale resolution challenge the experimentalists with a variety of specific constraints. For example, electronic noise is often present with great amplitudes from piezo-driven motors and other equipment, such as the power supplies of detectors. Furthermore, a multitude of devices and detectors needs to be arranged at optimized geometry without interfering with each other nor inducing vibrations. Figure&#160;1 depicts a typical setup for XBIC measurements in combination with XRF and small/wide angle X-ray scattering (SAXS/WAXS) measurements.

<table border="0" cellpadding="0" cellspacing="0" style="width:728px;" width="728">
	<tbody>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">BNC cabling and connectors</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td style="width:172px;">From generall cable suppliers</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Chopper blade</td>
			<td style="width:134px;">Thorlabs</td>
			<td style="width:123px;">MC1F10HP</td>
			<td>Apart from technical compatibility of the chopper wheel with the chopper system, it should be checked that the chopper blade sufficiently blocks the X-ray beam.</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Conductive silver paint</td>
			<td style="width:134px;">Conrad</td>
			<td style="width:123px;">530042</td>
			<td>Alternative products can be obtained from Pelco and others</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Copper wires</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td>From cable suppliers for contacting of the solar cell</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Current Preamplifier</td>
			<td style="width:134px;">Standford</td>
			<td style="width:123px;">SR570</td>
			<td>Alternatives include the Keithley 487 or 6487 Picoammeter.&#160;</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Device under test (DUT)</td>
			<td style="width:134px;"></td>
			<td></td>
			<td>Suitable device for XBIC measurements.</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Holder with printed circuit board</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td>Custom design</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Kinematic sample mount</td>
			<td style="width:134px;">Thorlabs</td>
			<td style="width:123px;">KB25/M</td>
			<td>Optional, allows easy positioning and changing of sample. Alternatives include the M-BK-1A from Newport</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:300px;">Lock-in Amplifier</td>
			<td style="width:134px;">Zurich Instruments</td>
			<td style="width:123px;">UHFLI or MFLI</td>
			<td>Whereas the MFLI has current preamplifiers included, the UHFLI requires an external current preamplifier but offers more options. Therefore, the UHFLI was used for the presented experiment.</td>
		</tr>
		<tr height="42">
			<td height="42" style="height:42px;width:300px;">Measurement control/data acquisition unit</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td>Available at different synchrotrons.</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Optical Chopper</td>
			<td style="width:134px;">Thorlabs</td>
			<td>MC2000B(-EC)</td>
			<td>Alternatives include the choppers SR540 from Stanford Research Systems, or model 3502 from Newport.</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">Polyimide tape</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td>Rolls with different widths and thicknesses are available</td>
		</tr>
		<tr height="21">
			<td height="21" style="height:21px;width:300px;">X-ray source</td>
			<td style="width:134px;"></td>
			<td style="width:123px;"></td>
			<td>Available at different synchrotrons</td>
		</tr>
	</tbody>
</table>

x-ray beam induced current measurements for multi-modal x-ray microscopy of solar cells

X-ray beam induced current (XBIC) measurements allow mapping of&#160;the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is employed simultaneously with other techniques within a multi-modal X-ray microscopy approach. An example is given herein combining XBIC with X-ray fluorescence to enable point-by-point correlations of the electrical performance with chemical composition. For the highest signal-to-noise ratio in XBIC measurements, lock-in amplification plays a crucial role. By this approach, the X-ray beam is modulated by an optical chopper upstream of the sample. The modulated X-ray beam induced electrical signal is amplified and demodulated to the chopper frequency using a lock-in amplifier. By optimizing low-pass filter settings, modulation frequency, and amplification amplitudes, noise can efficiently be suppressed for the extraction of a clear XBIC signal. A similar setup can be used to measure the X-ray beam induced voltage (XBIV). Beyond standard XBIC/XBIV measurements, XBIC can be measured with bias light or bias voltage applied such that outdoor working conditions of solar cells can be reproduced during in-situ and operando measurements. Ultimately, the multi-modal and multi-dimensional evaluation of electronic devices at the nanoscale enables new insights into the complex dependencies between composition, structure, and performance, which is an important step towards solving the materials&#39; paradigm.

Watch this Scientific Journal Video about X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells at JoVE.com

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

X-ray beam induced current (XBIC) measurements allow mapping of&#160;the nanoscale performance of electronic devices such as solar cells. Ideally, XBIC is ...

x-ray-beam-induced-current-measurements-for-multi-modal-x-ray

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13.6K 조회수.  Deutsches Elektronen-Synchrotron. A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray microprobe.

비디오: X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

Reservoir Condition Pore-scale Imaging of Multiple Fluid Phases Using X-ray Microtomography

X-ray microtomography was used to image, at a resolution of 6.6 &#181;m, the pore-scale arrangement of residual carbon dioxide ganglia in the pore-space of a carbonate rock at pressures and temperatures representative of typical formations used for CO2 storage. Chemical equilibrium between the CO2, brine and rock phases was maintained using a high pressure high temperature reactor, replicating conditions far away from the injection site. Fluid flow was controlled using high pressure high temperature syringe pumps. To maintain representative in-situ conditions within the micro-CT scanner a carbon fiber high pressure micro-CT coreholder was used. Diffusive CO2 exchange across the confining sleeve from the pore-space of the rock to the confining fluid was prevented by surrounding the core with a triple wrap of aluminum foil. Reconstructed brine contrast was modeled using a polychromatic x-ray source, and brine composition was chosen to maximize the three phase contrast between the two fluids and the rock. Flexible flow lines were used to reduce forces on the sample during image acquisition, potentially causing unwanted sample motion, a major shortcoming in previous techniques. An internal thermocouple, placed directly adjacent to the rock core, coupled with an external flexible heating wrap and a PID controller was used to maintain a constant temperature within the flow cell. Substantial amounts of CO2 were trapped, with a residual saturation of 0.203 &#177; 0.013, and the sizes of larger volume ganglia obey power law distributions, consistent with percolation theory.

We present a methodology for the imaging of multiple fluid phases at reservoir conditions by the use of x-ray microtomography. We show some representative results of capillary trapping in a carbonate rock sample.

여러 유체 페이즈 저수지 조건 기공 크기의 이미징 X 레이 Microtomography 사용

X-ray microtomography was used to image, at a resolution of 6.6 &#181;m, the pore-scale arrangement of residual carbon dioxide ganglia in the pore-space ...

연구

공학

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles

Energy dispersive X-ray spectroscopy within the scanning transmission electron microscope (STEM) provides accurate elemental analysis with high spatial resolution, and is even capable of providing atomically resolved elemental maps. In this technique, a highly focused electron beam is incident upon a thin sample and the energy of emitted X-rays is measured in order to determine the atomic species of material within the beam path. This elementally sensitive spectroscopy technique can be extended to three dimensional tomographic imaging by acquiring multiple spectrum images with the sample tilted along an axis perpendicular to the electron beam direction.
Elemental distributions within single nanoparticles are often important for determining their optical, catalytic and magnetic properties. Techniques such as X-ray tomography and slice and view energy dispersive X-ray mapping in the scanning electron microscope provide elementally sensitive three dimensional imaging but are typically limited to spatial resolutions of &gt; 20 nm. Atom probe tomography provides near atomic resolution but preparing nanoparticle samples for atom probe analysis is often challenging. Thus, elementally sensitive techniques applied within the scanning transmission electron microscope are uniquely placed to study elemental distributions within nanoparticles of dimensions 10-100 nm.
Here, energy dispersive X-ray (EDX) spectroscopy within the STEM is applied to investigate the distribution of elements in single AgAu nanoparticles. The surface segregation of both Ag and Au, at different nanoparticle compositions, has been observed.

The use of energy dispersive X-ray tomography in the scanning transmission electron microscope to characterize elemental distributions within single nanoparticles in three dimensions is described.

개별 나노 입자의 3D 원소 매핑에 대한 에너지 분산 X 선 단층 촬영

Energy dispersive X-ray spectroscopy within the scanning transmission electron microscope (STEM) provides accurate elemental analysis with high spatial ...

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography

Imaging morphological changes that occur during the lifetime of rechargeable batteries is necessary to understand how these devices fail. Since the advent of lithium-ion batteries, researchers have known that the lithium metal anode has the highest theoretical energy density of any anode material. However, rechargeable batteries containing a lithium metal anode are not widely used in consumer products because the growth of lithium dendrites from the anode upon charging of the battery causes premature cell failure by short circuit. Lithium dendrites can also form in commercial lithium-ion batteries with graphite anodes if they are improperly charged. We demonstrate that lithium dendrite growth can be studied using synchrotron-based hard X-ray microtomography. This non-destructive imaging technique allows researchers to study the growth of lithium dendrites, in addition to other morphological changes inside batteries, and subsequently develop methods to extend battery life.

Synchrotron-based hard X-ray microtomography is used to image the electrochemical growth of dendrites from a lithium metal electrode through a solid polymer electrolyte membrane.

싱크로 기반 하드 X 선 Microtomography를 사용하여 배터리의 실패 분석

Imaging morphological changes that occur during the lifetime of rechargeable batteries is necessary to understand how these devices fail. Since the advent ...

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

A procedure for a technique to measure the transverse coherence of synchrotron radiation X-ray sources using a single phase grating interferometer is reported. The measurements were demonstrated at the 1-BM bending magnet beamline of the Advanced Photon Source (APS) at Argonne National Laboratory (ANL). By using a 2-D checkerboard &#960;/2 phase-shift grating, transverse coherence lengths were obtained along the vertical and horizontal directions as well as along the 45&#176; and 135&#176; directions to the horizontal direction. Following the technical details specified in this paper, interferograms were measured at different positions downstream of the phase grating along the beam propagation direction. Visibility values of each interferogram were extracted from analyzing harmonic peaks in its Fourier Transformed image. Consequently, the coherence length along each direction can be extracted from the evolution of visibility as a function of the grating-to-detector distance. The simultaneous measurement of coherence lengths in four directions helped identify the elliptical shape of the coherence area of the Gaussian-shaped X-ray source. The reported technique for multiple-direction coherence characterization is important for selecting the appropriate sample size and orientation as well as for correcting the partial coherence effects in coherence scattering experiments. This technique can also be applied for assessing coherence preserving capabilities of X-ray optics.

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray optics.

2-D 바둑판 위상 격자를 사용하여 여러 길을 따라 X 선 빔 일관성의 측정

A procedure for a technique to measure the transverse coherence of synchrotron radiation X-ray sources using a single phase grating interferometer is ...

Speciation and Bioavailability Measurements of Environmental Plutonium Using Diffusion in Thin Films

The biological uptake of plutonium (Pu) in aquatic ecosystems is of particular concern since it is an alpha-particle emitter with long half-life which can potentially contribute to the exposure of biota and humans. The diffusive gradients in thin films technique is introduced here for in-situ measurements of Pu bioavailability and speciation. A diffusion cell constructed for laboratory experiments with Pu and the newly developed protocol make it possible to simulate the environmental behavior of Pu in model solutions of various chemical compositions. Adjustment of the oxidation states to Pu(IV) and Pu(V) described in this protocol is essential in order to investigate the complex redox chemistry of plutonium in the environment. The calibration of this technique and the results obtained in the laboratory experiments enable to develop a specific DGT device for in-situ Pu measurements in freshwaters. Accelerator-based mass-spectrometry measurements of Pu accumulated by DGTs in a karst spring allowed determining the bioavailability of Pu in a mineral freshwater environment. Application of this protocol for Pu measurements using DGT devices has a large potential to improve our understanding of the speciation and the biological transfer of Pu in aquatic ecosystems.

The technique of diffusive gradients in thin films (DGT) is proposed for speciation studies of plutonium. This protocol describes diffusion experiments probing the behavior of Pu(IV) and Pu(V) in presence of organic matter. DGTs deployed in a karstic spring allow assessment of the bioavailability of Pu.

박막의 확산을 사용하여 환경 플루토늄의 분화 및 생체 이용률 측정

The biological uptake of plutonium (Pu) in aquatic ecosystems is of particular concern since it is an alpha-particle emitter with long half-life which can ...

Protocol of Electrochemical Test and Characterization of Aprotic Li-O2 Battery

We demonstrate a method for electrochemical testing of an aprotic Li-O2 battery. An aprotic Li-O2 battery is made of a Li-metal anode, an aprotic electrolyte, and an O2-breathing cathode. The aprotic electrolyte is a solution of lithium salt with aprotic solvent; and porous carbon is commonly used as the cathode substrate. To improve the performance, an electrocatalyst is deposited onto the porous carbon substrate by certain deposition methods, such as atomic layer deposition (ALD) and wet-chemistry reaction. The as-prepared cathode materials are characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), and X-ray absorption near edge structure (XANES). A Swagelok-type cell, sealed in a glass chamber filled with pure O2, is used for the electrochemical test on a battery test system. The cells are tested under either capacity-controlled mode or voltage controlled mode. The reaction products are investigated by electron microscopy, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy, and Raman spectroscopy to study the possible pathway of oxygen reduction reaction (ORR) and oxygen evolution reaction (OER). This protocol demonstrates a systematic and efficient arrangement of routine tests of the aprotic Li-O2 battery, including the electrochemical test and characterization of battery materials.

Protocol of Electrochemical Test and Characterization of Aprotic Li-O2 Battery

A protocol for the electrochemical testing of an aprotic Li-O2 battery with the preparation of electrodes and electrolytes and an introduction of the frequently used methods of characterization is presented here.

비 양성 자성 리튬 O의 전기 시험 프로토콜 및 특성<sub&gt; 2</sub&gt; 배터리

We demonstrate a method for electrochemical testing of an aprotic Li-O2 battery. An aprotic Li-O2 battery is made of a Li-metal anode, an aprotic ...

Dynamic Pore-scale Reservoir-condition Imaging of Reaction in Carbonates Using Synchrotron Fast Tomography

Underground storage permanence is a major concern for carbon capture and storage. Pumping CO2 into carbonate reservoirs has the potential to dissolve geologic seals and allow CO2 to escape. However, the dissolution processes at reservoir conditions are poorly understood. Thus, time-resolved experiments are needed to observe and predict the nature and rate of dissolution at the pore scale. Synchrotron fast tomography is a method of taking high-resolution time-resolved images of complex pore structures much more quickly than traditional &#181;-CT. The Diamond Lightsource Pink Beam was used to dynamically image dissolution of limestone in the presence of CO2-saturated brine at reservoir conditions. 100 scans were taken at a 6.1 &#181;m resolution over a period of 2 hours. The images were segmented and the porosity and permeability were measured using image analysis and network extraction. Porosity increased uniformly along the length of the sample; however, the rate of increase of both porosity and permeability slowed at later times.

Synchrotron fast tomography was used to dynamically image dissolution of limestone in the presence of CO2-saturated brine at reservoir conditions. 100 scans were taken at a 6.1 &#181;m resolution over a period of 2 h.

싱크로 빠른 단층 촬영을 사용하여 탄산염의 반응의 동적 기공 규모의 저수지 조건 이미징

Underground storage permanence is a major concern for carbon capture and storage. Pumping CO2 into carbonate reservoirs has the potential to dissolve ...

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

In failure analysis, device characterization and reverse engineering of light emitting diodes (LEDs), and similar electronic components of micro-characterization, plays an important role. Commonly, different techniques like X-ray computed tomography (CT), light microscopy (LM) and scanning electron microscopy (SEM) are used separately. Similarly, the results have to be treated for each technique independently. Here a comprehensive study is shown which demonstrates the potentials leveraged by linking CT, LM and SEM. In depth characterization is performed on a white emitting LED, which can be operated throughout all characterization steps. Major advantages are: planned preparation of defined cross sections, correlation of optical properties to structural and compositional information, as well as reliable identification of different functional regions. This results from the breadth of information available from identical regions of interest (ROIs): polarization contrast, bright and dark-field LM images, as well as optical images of the LED cross section in operation. This is supplemented by SEM imaging techniques and micro-analysis using energy dispersive X-ray spectroscopy.

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography CT and Light Microscopy LM Correlated with Scanning Electron Microscopy SEM

A workflow for comprehensive micro-characterization of active optical devices is outlined. It contains structural as well as functional investigations by means of CT, LM and SEM. The method is demonstrated for a white LED which can be still be operated during characterization.

(SEM) X 선 컴퓨터 단층 촬영 (CT) 및 주사 전자 현미경과 상관 광학 현미경 (LM)의 조합에 따라 LED를 깊이 분석에서

In failure analysis, device characterization and reverse engineering of light emitting diodes (LEDs), and similar electronic components of ...

Digital Printing of Titanium Dioxide for Dye Sensitized Solar Cells

Silicon solar cell manufacturing is an expensive and high energy consuming process. In contrast, dye sensitized solar cell production is less environmentally damaging with lower processing temperatures presenting a viable and low cost alternative to conventional production. This paper further enhances these environmental credentials by evaluating the digital printing and therefore additive production route for these cells. This is achieved here by investigating the formation and performance of a metal oxide photoelectrode using nanoparticle sized titanium dioxide. An ink-jettable material was formulated, characterized and printed with a piezoelectric inkjet head to produce a 2.6 &#181;m thick layer. The resultant printed layer was fabricated into a functioning cell with an active area of 0.25 cm2 and a power conversion efficiency of 3.5%. The binder-free formulation resulted in a reduced processing temperature of 250 &#176;C, compatible with flexible polyamide substrates which are stable up to temperatures of 350 &#730;C. The authors are continuing to develop this process route by investigating inkjet printing of other layers within dye sensitized solar cells.

This paper investigates the suitability of inkjet printing for the manufacturing of dye-sensitized solar cells. A binder-free TiO2 nanoparticle ink was formulated and printed onto a FTO glass substrate. The printed layer was fabricated into a cell with an active area of 0.25 cm2 and an efficiency of 3.5%.

염료 감응 형 태양 전지에 대한 이산화 티타늄의 디지털 인쇄

Silicon solar cell manufacturing is an expensive and high energy consuming process. In contrast, dye sensitized solar cell production is less ...

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

X-ray spectra provide a wealth of information on high temperature plasmas; for example electron temperature and density can be inferred from line intensity ratios. By using a Johann spectrometer viewing the plasma, it is possible to construct profiles of plasma parameters such as density, temperature, and velocity with good spatial and time resolution. However, benchmarking atomic code modeling of X-ray spectra obtained from well-diagnosed laboratory plasmas is important to justify use of such spectra to determine plasma parameters when other independent diagnostics are not available. This manuscript presents the operation of the High Resolution X-ray Crystal Imaging Spectrometer with Spatial Resolution (HIREXSR), a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma. In addition, this manuscript covers a laser blow-off system that can introduce such ions to the plasma with precise timing to allow for perturbative studies of transport in the plasma.

X-ray spectra provide a wealth of information on high temperature plasmas. This manuscript presents the operation of a high wavelength resolution spatially imaging X-ray spectrometer used to view hydrogen- and helium-like ions of medium atomic number elements in a tokamak plasma.