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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

1.2K Views

05:34 min

June 30th, 2023

DOI :

10.3791/64823-v

June 30th, 2023


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Contact Mode Atomic Force Microscopy

Hoofdstukken in deze video

0:04

Introduction

0:31

Bacterial Sample Preparation and AFM Measurements

3:10

Results: Atomic Force Contact Microscopic Analysis of Bacterial Cultures Under Nanoparticle Influence

4:46

Conclusion

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