Preparation of Nanoparticles for ToF-SIMS and XPS Analysis
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06:24 min
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September 13th, 2020
DOI :
September 13th, 2020
•Rozdziały w tym wideo
0:05
Introduction
0:45
Nanoparticle Suspension Preparation, Drop-Dry Deposition, and Spin Coating Deposition
2:24
Nanoparticle Powder Deposition
3:15
Nanoparticle Suspension Cryofixation
4:06
Results: Representative Nanoparticle Preparation for Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS) Analysis
5:41
Conclusion
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