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Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy (VA-TIRFM)

DOI :

10.3791/4133-v

October 2nd, 2012

October 2nd, 2012

10,017 Views

1Hochschule Aalen, Institut für Angewandte Forschung

Topology of cell adhesion on a substrate is measured with nanometre precision by variable-angle total internal reflection fluorescence microscopy (VA-TIRFM).

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Nanotopology

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