JoVE Logo
Faculty Resource Center

Sign In

3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

DOI :

10.3791/61065-v

7:10 min

April 29th, 2020

April 29th, 2020

1,357 Views

1Łukasiewicz Research Network-Institute of Electronic Materials Technology

The presented method describes how to identify and solve measurement artifacts related to secondary ion mass spectrometry as well as obtain realistic 3D distributions of impurities/dopants in solid state materials.

Tags

3D Depth Profile Reconstruction

-- Views

Related Videos

article

Analyzing Protein Dynamics Using Hydrogen Exchange Mass Spectrometry

article

Visualization of Ambient Mass Spectrometry with the Use of Schlieren Photography

article

Analyzing the Photo-oxidation of 2-propanol at Indoor Air Level Concentrations Using Field Asymmetric Ion Mobility Spectrometry

article

An HS-MRM Assay for the Quantification of Host-cell Proteins in Protein Biopharmaceuticals by Liquid Chromatography Ion Mobility QTOF Mass Spectrometry

article

Real-time Breath Analysis by Using Secondary Nanoelectrospray Ionization Coupled to High Resolution Mass Spectrometry

article

Synthesis and Mass Spectrometry Analysis of Oligo-peptoids

article

An Efficient Sample Preparation Method to Enhance Carbohydrate Ion Signals in Matrix-assisted Laser Desorption/Ionization Mass Spectrometry

article

High-throughput and Comprehensive Drug Surveillance Using Multisegment Injection-Capillary Electrophoresis-Mass Spectrometry

article

Imaging Corrosion at the Metal-Paint Interface Using Time-of-Flight Secondary Ion Mass Spectrometry

article

Ion Mobility-Mass Spectrometry Techniques for Determining the Structure and Mechanisms of Metal Ion Recognition and Redox Activity of Metal Binding Oligopeptides

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved