Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Analysis of the Metal-Paint Corrosion Interface
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Results: Comparison of Corroded and Non-Corroded Aluminum-Paint Interfaces
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Conclusion
필기록
This approach reveals the corrosion process at the metal-paint interface, providing insight into mechanical and chemical changes at the interface with high surface sensitivity. Time-of-flight secondary ion mass spectrometry, or ToF-SIMS, is a powe
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Time-of-flight secondary ion mass spectrometry is applied to demonstrate the chemical mapping and corrosion morphology at the metal-paint interface of an aluminum alloy after being exposed to a salt solution compared with a specimen exposed to air.