Atom Probe Tomography Analysis of Exsolved Mineral Phases

Summary

Analysis of the morphology, composition, and spacing of exsolution lamellae can provide essential information to understand geological processes related to volcanism and metamorphism. We present a novel application of APT for the characterization of such lamellae and compare this approach to the conventional use of electron microscopy and FIB-based nanotomography.

Abstract

Element diffusion rates and temperature/pressure control a range of fundamental volcanic and metamorphic processes. Such processes are often recorded in lamellae exsolved from host mineral phases. Thus, the analysis of the orientation, size, morphology, composition and spacing of exsolution lamellae is an area of active research in the geosciences. The conventional study of these lamellae has been conducted by scanning electron microscopy (SEM) and transmission electron microscopy (TEM), and more recently with focused ion beam (FIB)-based nanotomography, yet with limited chemical information. Here, we explore the use of atom probe tomography (APT) for the nanoscale analysis of ilmenite exsolution lamellae in igneous titanomagnetite from ash deposits erupted from the active Soufrière Hills Volcano (Montserrat, British West Indies). APT allows the precise calculation of interlamellar spacings (14–29 ± 2 nm) and reveals smooth diffusion profiles with no sharp phase boundaries during the exchange of Fe and Ti/O between the exsolved lamellae and the host crystal. Our results suggest that this novel approach permits nanoscale measurements of lamellae composition and interlamellar spacing that may provide a means to estimate the lava dome temperatures necessary to model extrusion rates and lava dome failure, both of which play a key role in volcanic hazard mitigation efforts.

Introduction

The study of chemical mineralogy has been a major source of information within the field of Earth Sciences for more than a century, as minerals actively record geological processes during and after their crystallization. Physio-chemical conditions of these processes, such as temperature changes during volcanism and metamorphism, are recorded during mineral nucleation and growth in the form of chemical zonation, striations, and lamellae, among others. Exsolution lamellae form when a phase unmixes into two separate phases in the solid state. The analysis of the orientation, size, morphology, and spacing of such exsolution lamellae can provide essential information to un....

Protocol

1. Sourcing, selection, and preparation of mineral grains

NOTE: Samples were obtained from the catalogued collection at the Montserrat Volcano Observatory (MVO) and derived from falling deposits originating from a vigorous ash venting episode at Soufrière Hills Volcano that occurred on 5 October, 2009; this was one of 13 similar events over a course of three days¹⁴. This ash venting preceded a new phase of lava dome growth (phase 5) that commenced on 9 October. Previous analysis of this sample showed it to be a combination of dense dome rock fragments, glassy particles, and accidental lithics¹⁴

Results

Like many titanomagnetite crystals from various stages of the Soufrière Hills Volcano (SHV) eruption, the crystal analyzed here contains exsolution lamellae <10 µm in thickness, visible in secondary SEM images (Figure 1d), which separate zones of Ti-rich magnetite, indicating a C2 stage of oxidation¹⁸. Based upon the SEM images, spacing between these lamellae ranges from 2 to 6 µm (n = 15). Four titanomagnetite specimen tips, referred as 20.......

Discussion

3D APT data reconstructions allow a precise measurement of the interlamellar spacing in the analyzed crystal at a resolution three orders of magnitude higher than those measured from conventional SEM images. This indicates that atomic variations in chemistry occur over a spatial extent three orders of magnitude smaller than optically observable mineralogical changes. Also, the measured interlamellar distances (29 nm and 14 nm), are consistent with the length scale for oxyexsolution as opposed to that for nucleation and g.......

Materials

Name	Company	Catalog Number	Comments
InTouchScope Secondary Electron Microscope (SEM)	JEOL	JSM-6010PLUS/LA
Focus Ion Beam (FIB) Secondary Electron Microscope (SEM)	TESCAN	LYRA XMU
Local Electrode Atom Probe (LEAP)	CAMECA	5000 XS
Integrated Visualization and Analysis Software (IVAS, version 3.6.12).			processing software