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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

DOI :

10.3791/54235-v

September 28th, 2016

September 28th, 2016

11,479 Views

1Department of Physics and Institute of Nanoscience, National Chung Hsing University, 2Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, 3National Center for High-Performance Computing

This paper reports the nanomaterial fabrication of a fullerene Si substrate inspected and verified by nanomeasurements and molecular dynamic simulation.

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