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Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

11.5K Views

13:58 min

September 28th, 2016

DOI :

10.3791/54235-v

September 28th, 2016

11,544 Views

1Department of Physics and Institute of Nanoscience, National Chung Hsing University, 2Metallurgy Section, Materials & Electro-Optics Research Division, National Chung-Shan Institute of Science and Technology, 3National Center for High-Performance Computing

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Keywords C84 embedded Si Substrate
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