Results: Recent Advances in Atomic Force Microscopy for Surface Property Studies
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Transcrição
Atomic force microscopy, or AFM cantilever-based nanoindentation, can be used to determine the nanoscale mechanical properties of materials ranging modulus, from kilopascals to gigapascals in both air and fluid. AFM cantilever-based nanoindentatio
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Quantifying the contact area and force applied by an atomic force microscope (AFM) probe tip to a sample surface enables nanoscale mechanical property determination. Best practices to implement AFM cantilever-based nanoindentation in air or fluid on soft and hard samples to measure elastic modulus or other nanomechanical properties are discussed.