JoVE Logo
Faculty Resource Center

Sign In

Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue

DOI :

10.3791/2588-v

8:57 min

July 6th, 2011

July 6th, 2011

27,490 Views

1Centre of interdisciplinary electron microscopy, École Polytechnique Fédérale de Lausanne

This protocol describes how resin embedded brain tissue can be prepared and imaged in the three dimensions in the focussed ion beam, scanning electron microscope.

Tags

Focussed Ion Beam Milling

-- Views

Related Videos

article

Preparation of Mouse Brain Tissue for Immunoelectron Microscopy

article

Genetic Manipulation of Cerebellar Granule Neurons In Vitro and In Vivo to Study Neuronal Morphology and Migration

article

The Olfactory System as a Model to Study Axonal Growth Patterns and Morphology In Vivo

article

Double-barreled and Concentric Microelectrodes for Measurement of Extracellular Ion Signals in Brain Tissue

article

Characterizing Multiscale Mechanical Properties of Brain Tissue Using Atomic Force Microscopy, Impact Indentation, and Rheometry

article

Analysis of Brain Mitochondria Using Serial Block-Face Scanning Electron Microscopy

article

Preparation of Non-human Primate Brain Tissue for Pre-embedding Immunohistochemistry and Electron Microscopy

article

Making, Testing, and Using Potassium Ion Selective Microelectrodes in Tissue Slices of Adult Brain

article

Delivery of Antibodies into the Brain Using Focused Scanning Ultrasound

article

Horizontal Hippocampal Slices of the Mouse Brain

JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved