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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam

26.1K Views

10:54 min

July 26th, 2014

DOI :

10.3791/51463-v

July 26th, 2014

26,129 Views

1Department of Engineering Sciences, Uppsala University, 2Gatan Inc., 3Department of Microbiology, Swedish University of Agricultural Sciences, 4Physics Department, University of Oslo

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Keywords Cryo electron Microscopy
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