Sign In

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

949 Views

05:34 min

June 30th, 2023

DOI :

10.3791/64823-v

June 30th, 2023

949 Views

Transcript

Explore More Videos

Contact Mode Atomic Force Microscopy
JoVE Logo

Privacy

Terms of Use

Policies

Research

Education

ABOUT JoVE

Copyright © 2024 MyJoVE Corporation. All rights reserved