Iniciar sesión

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

3.0K Views

08:20 min

October 25th, 2021

DOI :

10.3791/62886-v

October 25th, 2021

3,039 Views

Transcribir

Explorar más videos

3D correlative FIB Milling
article

Now Playing

08:20

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

3.0K Views

JoVE Logo

Privacidad

Condiciones de uso

Políticas

Investigación

Educación

ACERCA DE JoVE

Copyright © 2025 MyJoVE Corporation. Todos los derechos reservados