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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

3.0K Views

08:20 min

October 25th, 2021

DOI :

10.3791/62886-v

October 25th, 2021


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3D correlative FIB Milling
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08:20

Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography

3.0K Views

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