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Author Spotlight: A Machine-Vision Approach to Transmission Electron Microscopy Workflows, Results Analysis and Data Management

741 Views

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02:37 min

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June 23rd, 2023

DOI :

10.3791/65446-v

June 23rd, 2023

•
743 Views

1Protochips, Inc.

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Keywords Machine vision

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TEM Workflows, Results Analysis, and Data Management Using a Machine-Vision Approach
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